Spring Probes
Standard spring-loaded structures for ICT and FCT fixtures.
- > 1,000,000 mating cycles
- Stroke 0.5β15 mm
- Current range 1β50 A
Professional support for semiconductor, PCB, ICT and FCT test environments β built around durability, accuracy and fast delivery.
Complete probe families covering general electronics, RF, high-current and custom testing scenarios.
Standard spring-loaded structures for ICT and FCT fixtures.
Low-loss, high-frequency signal probing designed for precision RF verification.
Heavy-duty probe design for power electronics, batteries and fast charging systems.
Rapid customization based on fixture drawings, board stackups and production demand.
Broadly deployed across electronics manufacturing and high-reliability testing environments.
Why engineering teams choose our test probes for repeated production use.
Standard parts ship in 2β5 days, custom designs in 7β15 days.
Precision tolerance to Β±0.01 mm for reliable, repeatable measurements.
ISO-driven production controls and full process traceability.
Probe lifespan engineered above one million contact cycles.
Our engineering team is ready to support probe selection, fixture matching and fast-turn customization.